1. OPUS

Auflistung nach Institut Institut für Technische Optik

Gehe zu: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
oder geben Sie die Anfangszeichen ein:  
Anzeige der Treffer 123 bis 142 von 167 < zurück   nächste
ErscheinungsdatumTitelAutor(en)
2013Phase errors in high line density CGH used for aspheric testing : beyond scalar approximationPeterhänsel, Sandy; Pruss, Christof; Osten, Wolfgang
1991Phase shifting in an oblique incidence interferometerBoebel, Doris; Packroß, Bernd; Tiziani, Hans J.
1986Photothermal interferometry for nondestructive subsurface defect detectionSodnik, Zoran; Tiziani, Hans J.
2012Polarization scramblers with plasmonic meander-type metamaterialsSchau, Philipp; Fu, Liwei; Frenner, Karsten; Schäferling, Martin; Schweizer, Heinz; Giessen, Harald; Gaspar Venancio, Luis Miguel; Osten, Wolfgang
1998Positioning of noncooperative objects using joint transform correlation combined with fringe projectionHaist, Tobias; Schönleber, Martin; Tiziani, Hans J.
1982Real time metrology with BSO crystalsTiziani, Hans J.
1981Real-time contour holography using BSO crystalsKüchel, Michael; Tiziani, Hans J.
1980Real-time displacement and tilt analysis by a speckle technique using Bi12SiO20-crystalsTiziani, Hans J.; Leonhardt, Klaus; Klenk, Jürgen
1982Real-time measurements in optical metrologyTiziani, Hans J.
1987Rechnerunterstützte Laser-MeßtechnikTiziani, Hans J.
2011Remote laboratory for digital holographic metrologyWilke, Marc; Situ, Guohai; Aleksenko, Igor; Riedel, Margarita; Pedrini, Giancarlo; Jeschke, Sabina; Osten, Wolfgang
1987Remote nondestructive material analysis by photothermal interferometrySodnik, Zoran; Tiziani, Hans J.
1982Removing ambiguities in surface roughness measurementLeonhardt, Klaus; Tiziani, Hans J.
1993Resolution limits of active triangulation systems by defocusingSeitz, Günther; Tiziani, Hans J.
2021Scatter-plate microscopy with spatially coherent illumination and temporal scatter modulationLudwig, Stephan; Ruchka, Pavel; Pedrini, Giancarlo; Peng, Xiang; Osten, Wolfgang
1991Schnelle 3-D-Kamera mit adaptierbaren, hochauflösenden MarkierungscodesMalz, Reinhard; Tiziani, Hans J.
1990Self-induced photorefractive spatial frequency filterMöbus, Günter; Schmidt, B.; Tiziani, Hans J.
2017Short-range surface plasmonics: localized electron emission dynamics from a 60-nm spot on an atomically flat single-crystalline gold surfaceFrank, Bettina; Kahl, Philip; Podbiel, Daniel; Spektor, Grisha; Orenstein, Meir; Fu, Liwei; Weiss, Thomas; Horn-von Hoegen, Michael; Davis, Timothy J.; Meyer zu Heringdorf, Frank-J.; Giessen, Harald
1992A simplified multi-wavelength ESPI contouring technique based on a diode laser systemPeng, Xiang; Zou, Yunlu; Diao, Hongyan; Tiziani, Hans J.
1993A simplified multi-wavelength ESPI contouring technique based on a diode laser system. 2, Automatic fringe analysisPeng, Xiang; Zou, Yunlu; Pedrini, Giancarlo; Tiziani, Hans J.
Anzeige der Treffer 123 bis 142 von 167 < zurück   nächste