1. OPUS

Auflistung nach Autor Tiziani, Hans J.

Gehe zu: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
oder geben Sie die Anfangszeichen ein:  
Anzeige der Treffer 28 bis 47 von 144 < zurück   nächste
ErscheinungsdatumTitelAutor(en)
1992Contouring by electronic speckle pattern interferometry with quadruple-beam illuminationZou, Yunlu; Diao, Hongyan; Peng, Xiang; Tiziani, Hans J.
1992Contouring by modified dual-beam ESPI based on tilting illumination beamsPeng, Xiang; Diao, Hongyan; Zou, Yunlu; Tiziani, Hans J.
1992Contouring using two-wavelength electronic speckle pattern interferometry employing dual-beam illuminationsDiao, Hongyan; Peng, Xiang; Zou, Yunlu; Tiziani, Hans J.; Chen, L.
1987Current state of optical testingTiziani, Hans J.
1994Derivatives obtained directly from displacement dataZou, Yunlu; Pedrini, Giancarlo; Tiziani, Hans J.
1993Design consideration of a dual-beam ESPI optical system for contouringDiao, Hongyan; Zou, Yunlu; Tiziani, Hans J.
1993Design of diffractive optical elements for CO2-laser material processingHaupt, Christoph; Pahlke, Michael; Jäger, Ernst; Tiziani, Hans J.
1984Determination of average roughness and profile autocorrelation width of metallic surfaces with a white light sensorLeonhardt, Klaus; Kaufmann, Ekkehart; Tiziani, Hans J.
1994Diffractive optical elements for CO2 laser beam diagnosticsHembd, Christian; Tiziani, Hans J.
1993Diffraktive Elemente für die LasermaterialbearbeitungPahlke, Michael; Haupt, Christoph; Tiziani, Hans J.
1992Doppelheterodyn-Interferometrie für hochgenaue Vermessung im NahbereichFischer, Edgar; Dalhoff, Ernst; Ittner, Thomas; Sodnik, Zoran; Tiziani, Hans J.
1994Double heterodyne interferometer using a multimode laser diodeHan, Sen; Dalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
1993Double heterodyne interferometry for high precision distance measurementsDalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
1993Double pulse-electronic speckle interferometryPedrini, Giancarlo; Pfister, Berthold P.; Tiziani, Hans J.
1994Double pulse-electronic speckle interferometryPedrini, Giancarlo; Tiziani, Hans J.
1993Double pulse-electronic speckle interferometry (DP-ESPI)Pedrini, Giancarlo; Tiziani, Hans J.
1994Double-pulse electronic speckle interferometry for vibration analysisPedrini, Giancarlo; Tiziani, Hans J.
1990Dual wavelength heterodyne interferometry for rough surface measurementsFischer, Edgar; Sodnik, Zoran; Ittner, Thomas; Tiziani, Hans J.
1992Dual wavelength heterodyne interferometry using a matched grating set-upFischer, Edgar; Ittner, Thomas; Dalhoff, Ernst; Sodnik, Zoran; Tiziani, Hans J.
1990Dual-wavelength interferometer for surface profileManhart, Sigmund; Maurer, R.; Tiziani, Hans J.; Sodnik, Zoran; Fischer, Edgar; Mariani, A.; Bonsignori, R.; Margheri, Giancarlo; Giunti, C.; Zatti, Stefano
Anzeige der Treffer 28 bis 47 von 144 < zurück   nächste